| PART |
Description |
Maker |
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| AP160L AP160 |
8-BIT MICROCONTROLLER WITH 8KB OTP
ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component
Zener Diode; Zener Voltage Typ, Vz:5.1V; Vz Test Current, Izt:20mA; Power Dissipation, Pd:500mW; Package/Case:41-MiniDIP; Leaded Process Compatible
|
AMIC Technology Corporation
|
| TXS100ZA TXS100ZB TXS100ZY TXS75ZA TXS75ZB TXS75ZY |
Input voltage range 36ˇ75V DC Single 80ˇ100A output 1500V DC I/O electrical strength test voltage 输入电压范围3675V直流1500V的单80100A直流输出的I / O电气强度试验电压
Input voltage range 365V DC Single 8000A output 1500V DC I/O electrical strength test voltage
Input voltage range 36?5V DC Single 80?00A output 1500V DC I/O electrical strength test voltage
|
Power-One
|
| CS4373A-ISZ |
Low-power, High-performance Test DAC
Low-power, High-performance Test DAC SERIAL INPUT LOADING, 24-BIT DAC, PDSO28
|
Cirrus Logic, Inc.
|
| BCM1510TRP BCM1500TRP |
CALISTO™ Test and Reference Platform
CALISTO TEST AND REFERENCE PLATFORM
|
BOARDCOM[Broadcom Corporation.]
|
| 44242-0001 44242-0002 44242-0003 44242-0004 44242- |
Micro-Fit 3.0垄芒 Test Plugs Won隆炉t Damage Mating Contact
Micro-Fit 3.0 Test Plugs Won’t Damage Mating Contact
|
Molex Electronics Ltd.
|
| SST39LF200A-55-4E-B3K SST39LF800A-45-4E-B3K SST39V |
2 MBIT / 4 MBIT / 8 MBIT ( X 16 ) MULTI - PURPOSE FLASH
64 Mbit (x16) Multi-Purpose Flash Plus 128K X 16 FLASH 2.7V PROM, 70 ns, PBGA48
64 Mbit (x16) Multi-Purpose Flash Plus 256K X 16 FLASH 2.7V PROM, 70 ns, PDSO48
60Hz Power Quality Logger-Memobox; RoHS Compliant: NA 2兆位/ 4兆位/ 8兆位（x16）的多用途闪
64 Mbit (x16) Multi-Purpose Flash Plus 256K X 16 FLASH 2.7V PROM, 90 ns, PBGA48
64 Mbit (x16) Multi-Purpose Flash Plus 128K X 16 FLASH 2.7V PROM, 90 ns, PBGA48
64 Mbit (x16) Multi-Purpose Flash Plus 64兆位（x16）的多功能闪存加
64 Mbit (x16) Multi-Purpose Flash Plus 128K X 16 FLASH 3V PROM, 55 ns, PDSO48
Color Management System Feedback Controller
Bundle of Ultra Slim sensor with integrated LED, 12.9mm x 12.5mm PCB
Test, Calibration RoHS Compliant: NA
Color Management Controller with Integrated RGB Photosensor
Digital Multimeter; DMM Type:Handheld; DMM Response Type:True RMS; Series:Fluke 170; Calibrated:No RoHS Compliant: NA
Digital Multimeter; DMM Type:Handheld; DMM Response Type:True RMS; Series:Fluke 170; Certificate of Calibration:Yes With Data RoHS Compliant: NA
FLUKE-434/003 REFURBISHED BY NEWARK SERVICES
2-Input NOR Gate
IC LOGIC 1G86 SINGLE 2-INPUT EXCLUSIVE-OR GATE -40 85C SOT-23-5 3000/REEL
10-Element Bar Graph Array
2 Mbit / 4 Mbit / 8 Mbit (x16) Multi-Purpose Flash
|
Silicon Storage Technology, Inc.
SILICON STORAGE TECHNOLOGY INC
Silicon Storage Technol...
|
| MB4015NSC-3 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MD6022ASC-0 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MD6052ASZ-2 |
Electrical Characteristics Test Condition (Vs= 3 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
Electrical Characteristics Test Condition (Vs= 3 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
